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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-4 ; VDE 0884-135-4:2019-05 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 62435-2 ; VDE 0884-135-2:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More |
| DIN EN 62435-5 ; VDE 0884-135-5:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More |
| IEC 60050-551 | 1998-11 | International Electrotechnical Vocabulary - Part 551: Power electronics More |
| IEC 60068-2-17 | 1994-07 | Basic environmental testing procedures - Part 2: Tests - Test Q: Sealing More |
| IEC 60721-3-1 | 2018-02 | Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage More |
| IEC 60749-30 | 2005-01 | Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing More |
| IEC 61340-5-1 | 2016-05 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements More |
| IEC 61340-5-3 | 2015-07 | Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classification for packaging intended for electrostatic discharge sensitive devices More |
| IEC 61760-2 | 2007-04 | Surface mounting technology - Part 2: Transportation and storage conditions of surface mounting devices (SMD) - Application guide More |
| IEC 62258-1 | 2009-04 | Semiconductor die products - Part 1: Procurement and use More |
