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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-6 ; VDE 0884-135-6:2019-04 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-20 | 2008-12 | Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat More |
| IEC 60749-20-1 | 2009-04 | Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat More |
| IPC JEDEC J-STD-033D | 2018-03-01 | Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices More |
| DIN EN 60749-20-1 | 2009-10 | Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009); German version EN 60749-20-1:2009 More |
| DIN EN 62435-1 ; VDE 0884-135-1:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017 More |
| DIN EN 62435-2 ; VDE 0884-135-2:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More |
| DIN EN 62435-5 ; VDE 0884-135-5:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More |
| DIN ISO 2859-1 | 2014-08 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection (ISO 2859-1:1999 + Cor. 1:2001 + Amd.1:2011); Text in German and English More |
| IEC 47/2491/CDV ; IEC 62435-3 | 2018-08 | Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data More |
| IEC 47/2507/CD ; IEC 62435-7:2018-08 | 2018-08 | Long-term storage of electronic components - Part 7: Micro-electromechanical devices More |
