NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN VDE 0276-605/A1 ; VDE 0276-605/A1:1996-12 [Withdrawn] references following documents:

Document number Edition Title
IEC 60230 1966 Impulse tests on cables and their accessories More 
IEC 60502 1994-08 Extruded solid dielectric insulated power cables for rated voltages from 1 kV up to 30 kV More 
IEC 60811-1-1 1985 Common test methods for insulating and sheathing materials of electric cables. Part 1 : Methods for general application. Section One - Measurement of thickness and overall dimensions. Tests for determining the mechanical properties More 
IEC 60811-1-2 1985 Common test methods for insulating and sheathing materials of electric cables; part 1: methods for general application; section two: thermal ageing methods More 
IEC 60811-1-2 AMD 1 1989-10 Common test methods for insulating and sheathing materials of electric cables; part 1: methods for general application; section two: thermal ageing methods; amendment No. 1 to IEC 60811-1-2:1985 More 
IEC 60811-1-2 Corrigendum 1 1986 Common test methods for insulating and sheathing materials of electric cables - Part 1: Methods for general application - Section 2: Thermal ageing methods; Corrigendum 1 More 
IEC 60811-1-3 1985 Common test methods for insulating and sheathing materials of electric cables: part 1: methods for general application; section three: methods for determining the density, water absorption tests, shrinkage test More 
IEC 60811-1-4 1985 Common test methods for insulating and sheathing materials of electric cables. Part 1 : Methods for general application. Section Four - Tests at low temperature More 
IEC 60811-1-4 AMD 1 1993-09 Common test methods for insulating and sheathing materials of electric cables; part 1: methods for general application; section 4: test at low temperature; amendment 1 More 
IEC 60811-1-4 Corrigendum 1 1986 Common test methods for insulating and sheathing materials of electric cables - Part 1 : Methods for general application - Section 4: Tests at low temperature; Corrigendum 1 More