NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 62433-2 ; VDE 0847-33-2:2017-10 [CURRENT] references following documents:

Document number Edition Title
IEC 61967-4 AMD 1 2006-02 Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ώ/150 Ώ direct coupling method More 
IEC 61967-4 Corrigendum 1 2017-06 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 Ώ/150 Ώ direct coupling method - Corrigendum 1 More 
IEC 61967-4 Edition 1.1 2006-07 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 Ώ/150 Ώ direct coupling method More 
IEC 61967-5 2003-02 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday cage method More 
IEC 61967-6 2002-06 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More 
IEC 61967-6 AMD 1 2008-03 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method; Amendment 1 More 
IEC 61967-6 Corrigendum 1 2010-08 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More 
IEC 61967-6 Edition 1.1 2008-06 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More 
IEC 61967-8 2011-08 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method More 
ISO 8879 1986-10 Information processing; Text and office systems; Standard Generalized Markup Language (SGML) More