NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62435-1 ; VDE 0884-135-1:2017-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 62258-2 | 2011-05 | Semiconductor die products - Part 2: Exchange data formats More |
| IEC 62258-5 | 2006-08 | Semiconductor die products - Part 5: Requirements for information concerning electrical simulation More |
| IEC 62258-6 | 2006-08 | Semiconductor die products - Part 6: Requirements for information concerning thermal simulation More |
| IEC 62402 | 2007-06 | Obsolescence management - Application guide More |
| IEC 62435-1 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General More |
| IEC 62435-2 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms More |
| IEC 62435-5 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices More |
| IEC/TR 61340-5-2 | 2007-08 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide More |
| IEC/TR 62258-3 | 2010-08 | Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage More |
| IEC/TR 62380 | 2004-08 | Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment More |
