NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 62922 [Withdrawn] references following documents:

Document number Edition Title
IEC 60749-14 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) More 
IEC 61747-10-1 2013-07 Liquid crystal display devices - Part 10-1: Mechanical test methods More