NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61747-1 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60410 | 1973 | Sampling plans and procedures for inspection by attributes More |
| IEC 60747-1 | 1983 | Semiconductor devices. Discrete devices. Part 1 : General More |
| IEC 60747-10 ; QC 700000:1991-04 | 1991-04 | Semiconductor devices; part 10: generic specification for discrete devices and integrated circuits More |
| IEC 60747-5 | 1992-02 | Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices More |
| IEC 60749 | 1996-10 | Semiconductor devices - Mechanical and climatic test methods More |
| IEC 61747-5 | 1998-06 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods More |
