NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN IEC/TS 62132-9 ; VDE V 0847-22-9:2015-08 references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60050-904 | 2014-11 | International Electrotechnical Vocabulary - Part 904: Environmental standardization for electrical and electronic products and systems More |
| IEC 62132-1 | 2006-01 | Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions More |
| IEC/TS 61967-3 | 2014-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method More |
| DIN IEC/TS 61967-3 ; VDE V 0847-21-3:2015-08 | 2015-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014) More |
| IEC 61967-6 | 2002-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More |
| IEC/TR 61967-1-1 | 2010-05 | Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions - Near-field scan data exchange format More |
