NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN IEC/TS 61967-3 ; VDE V 0847-21-3:2015-08 referenced in following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN IEC/TS 62132-9 ; VDE V 0847-22-9:2015-08 | 2015-08 | Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014) More |
