NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62595-1-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60410 | 1973 | Sampling plans and procedures for inspection by attributes More |
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60747-10 ; QC 700000:1991-04 | 1991-04 | Semiconductor devices; part 10: generic specification for discrete devices and integrated circuits More |
| IEC 62595-1-2 | 2011-12 | LCD backlight unit - Part 1-2: Terminology and letter symbols More |
| QC 001002-2 | 1998-06 | IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 2: Documentation More |
| QC 001002-3 | 2005-06 | IEC Quality assessment system for Electronic Components (IECQ) - Rules of procedure - Part 3: Approval procedures More |
| IEC 60027-1 | 1992-12 | Letter symbols to be used in electrical technology; part 1: general More |
| IEC 60027-1 AMD 1 | 1997-05 | Letter symbols to be used in electrical technology - Part 1: General; Amendment 1 More |
| IEC 60027-1 AMD 2 | 2005-10 | Letter symbols to be used in electrical technology - Part 1: General; Amendment 2 More |
| IEC 60027-1 Corrigendum 1 | 1993-04 | Letter symbols to be used in electrical technology - Part 1: General; Corrigendum 1 More |
