NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN IEC 60747-11 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60147-2B | 1970 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods. More |
| IEC 60147-2C | 1970 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods. More |
| IEC 60147-2M | 1980 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods. More |
| IEC 60747-2 | 1983 | Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes More |
| IEC 60747-3 | 1985 | Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. More |
| IEC 60747-6 | 1983 | Semiconductor devices. Discrete devices. Part 6 : Thyristors More |
| IEC 60747-8 | 1984 | Semiconductor devices. Discrete devices. Part 8 : Field-effect transistors More |
| IEC 60749 | 1984 | Semiconductor devices. Mechanical and climatic test methods More |
