NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60747-15 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-12 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency More |
| IEC 60749-15 | 2010-10 | Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices More |
| IEC 60749-21 | 2011-04 | Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability More |
| IEC 60749-25 | 2003-07 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling More |
| IEC 60749-34 | 2010-10 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling More |
| IEC 60749-5 | 2003-01 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test More |
| IEC 60749-6 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature More |
| IEC 60112 | 2003-01 | Method for the determination of the proof and the comparative tracking indices of solid insulating materials More |
| IEC 61287-1 | 2005-09 | Railway applications - Power convertors installed on board rolling stock - Part 1: Characteristics and test methods More |
