NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60747-15 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60664-1 | 2007-04 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests More |
| IEC 60721-3-3 | 1994-12 | Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities; section 3: Stationary use at weatherprotected locations More |
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60270 | 2000-12 | High-voltage test techniques - Partial discharge measurements More |
| IEC 60747-2 | 2000-03 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes More |
| IEC 60747-6 | 2000-12 | Semiconductor devices - Part 6: Thyristors More |
| IEC 60747-7 | 2010-12 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors More |
| IEC 60747-8 | 2010-12 | Semiconductor devices - Discrete devices - Part 8: Field-effect transistors More |
| IEC 60747-9 | 2007-09 | Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs) More |
| IEC 60749-10 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock More |
