NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62047-5 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60747-16-4 | 2004-07 | Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches More |
| IEC 60747-16-1 | 2001-11 | Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers More |
| IEC 60749-10 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock More |
| IEC 60749-12 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency More |
| IEC 60749-27 | 2006-07 | Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) More |
| IEC 60749-5 | 2003-01 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test More |
