NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-40 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-37 | 2008-01 | Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer More |