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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [Withdrawn]

DIN IEC 60749
Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984

Title (German)

Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren; Identisch mit IEC 60749, Ausgabe 1984

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 1987-09
Original language German
Price from 85.30 €
Order from DIN Media
Table of contents

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