NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN IEC 60747-1 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60319 | 1978 | Presentation of reliability data on electronic components (or parts) More |
| IEC 60748-1 | 1984 | Semiconductor devices. Integrated circuits.. Part 1 : General More |
| IEC 60748-2 | 1985 | Semiconductor devices. Integrated circuits.. Part 2 : Digital integrated circuits More |
| IEC 60748-3 | 1986 | Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits More |
| IEC 60748-4 | 1987 | Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits. More |
| IEC 60749 | 1984 | Semiconductor devices. Mechanical and climatic test methods More |
| ISO 3 | 1973-04 | Preferred numbers; Series of preferred numbers More |