NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62341-1-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60410 | 1973 | Sampling plans and procedures for inspection by attributes More |
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 62341-5 | 2009-11 | Organic light emitting diode (OLED) displays - Part 5: Environmental testing methods More |
| IEC 62341-1-2 | 2007-11 | Organic light emitting diode displays - Part 1-2: Terminology and letter symbols More |
| IEC 62341-6-1 | 2009-05 | Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters More |
| ISO 2859-3 | 2005-05 | Sampling procedures for inspection by attributes - Part 3: Skip-lot sampling procedures More |
| ISO 2859-5 | 2005-06 | Sampling procedures for inspection by attributes - Part 5: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
| QC 001002-1 | 1998-06 | IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 1: Administration More |
| QC 001002-2 | 1998-06 | IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 2: Documentation More |
| QC 001002-2 AMD 1 | 2004-10 | IEC Quality Assessment System for Electronic Components (IECQ-CECC) - Rules of procedure - Part 2: Documentation, concerning a new clause 5, Regulations for component specifications and assessment specifications (fast track) More |
