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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

DIN EN 62149-2 [Withdrawn] references following documents:

Document number Edition Title
IEC 60749-1 2002-08 Semiconductor devices - Mechanical and climatic test methods - Part 1: General More 
IEC 60749-1 Corrigendum 1 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 1: General More 
IEC 60749-10 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock More 
IEC 60749-10 Corrigendum 1 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock More 
IEC 60749-11 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method More 
IEC 60749-11 Corrigendum 1 2003-01 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method More 
IEC 60749-11 Corrigendum 2 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method More 
IEC 60749-12 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency More 
IEC 60749-12 Corrigendum 1 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency More 
IEC 60749-13 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere More