NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN 45941-1 ; CECC 63000:1985-03 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60068-2-6 | 1982 | Basic environmental testing procedures. Part 2 : Tests. Test Fc and guidance: Vibration (sinusoidal) More |
| IEC 60068-2-7 | 1983 | Basic environmental testing procedures. Part 2 : Tests. Test Ga and guidance: Acceleration, steady state More |
| IEC 60134 | 1961 | System of limiting values of electronic tubes and valves and the adequate semiconductor devices More |
| IEC 60147-0B | 1969 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminolgy More |
| IEC 60147-0D | 1974 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. More |
| IEC 60147-1 | 1972 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics More |
| IEC 60148 | 1969 | Letter symbols for semiconductor devices and integrated microcircuits More |
| IEC 60148A | 1974 | Letter symbols for semiconductor devices and integrated microcircuits. More |
| IEC 60191-1 | 1966 | Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices More |
| IEC 60191-2 | 1966 | Mechanical standardization of semiconductor devices. Part 2 : Dimensions More |
