NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62040-1 ; VDE 0558-510:2009-06 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60755 | 1983 | General requirements for residual current operated protective devices More |
| IEC 61000-2-2 | 2002-03 | Electromagnetic compatibility (EMC) - Part 2-2: Environment; Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems More |
| IEC 61008-1 | 1996-12 | Residual current operated circuit-breakers without integral overcurrent protection for household and similar uses (RCCB's) - Part 1: General rules More |
| IEC 61009-1 | 1996-12 | Residual current operated circuit-breakers with integral overcurrent protection for household and similar uses (RCBOs) - Part 1: General rules More |
| DIN EN 60664-1 Beiblatt 3 ; VDE 0110-1 Beiblatt 3:2003-11 | 2003-11 | Insulation coordination for equipment within low-voltage systems - Supplement 3: Interface consideration; Application guide (IEC/TR 60664-2-2:2002) More |
| DIN EN 60664-4 ; VDE 0110-4:2006-06 | 2006-06 | Insulation coordination for equipment within low-voltage systems - Part 4: Consideration of high-frequency voltage stress (IEC 60664-4:2005); German version EN 60664-4:2006 More |
| DIN EN 60664-4 Berichtigung 1 ; VDE 0110-4 Berichtigung 1:2007-02 | 2007-02 | Insulation coordination for equipment within low-voltage systems - Part 4: Consideration of high-frequency voltage stress (IEC 60664-4:2005); German version EN 60664-4:2006, Corrigenda to DIN EN 60664-4 (VDE 0110-4):2006-06; CENELEC-Corrigendum October 2006 to EN 60664-4:2006 More |
| IEC 60050-131 | 2002-06 | International Electrotechnical Vocabulary - Part 131: Circuit theory More |
| IEC 60050-195 | 1998-08 | International Electrotechnical Vocabulary - Part 195: Earthing and protection against electric shock More |
| IEC 60439-1 | 1999-09 | Low-voltage switchgear and controlgear assemblies - Part 1: Type-tested and partially type-tested assemblies More |