NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-4-101 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-4 | 1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4 : Dynamic stress tests More |
| IEC 60512-5 | 1992-08 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 5: impact tests (free components), static load tests (fixed components), endurance tests and overload tests More |
| IEC 60512-6 | 1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6 : Climatic tests and soldering tests More |
| IEC 60512-7 | 1993-08 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 7: mechanical operating tests and sealing tests More |
| IEC 60512-8 | 1993-01 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 8: connector tests (mechanical) and mechanical tests on contacts and terminations More |
| IEC 60512-9 | 1992-04 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 9: miscellaneous tests More |
| IEC 60917 | 1988 | Modular order for the development of mechanical structures for electronic equipment practices More |
| IEC 60917 AMD 1 | 1993-02 | Modular order for the development of mechanical structures for electronic equipment practices; amendment 1 More |
| IEC 60917-2-2 | 1994-04 | Modular order for the development of mechanical structures for electronic equipment practices - Part 2: Sectional specification; interface co-ordination dimensions for the 25 mm equipment practice; section 2: Detail specification; dimensions for subracks, chassis, backplanes, front panels and plug-in units More |
| IEC 61076-1 ; QC 480000:1995-07 | 1995-07 | Connectors with assessed quality, for use in d.c., low frequency analogue and in digital high speed data applications - Part 1: Generic specification More |
