NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 60947-5-9 ; VDE 0660-216:2008-06 [CURRENT] references following documents:

Document number Edition Title
IEC 60446 1999-02 Basic and safety principles for man-machine interface, marking and identification - Identification of conductors by colours or numerals More 
IEC 60947-1 2004-03 Low-voltage switchgear and controlgear - Part 1: General rules More 
IEC 60947-5-2 1997-10 Low-voltage switchgear and controlgear - Part 5-2: Control circuit devices and switching elements - Proximity switches More 
IEC 60947-5-2 AMD 1 1999-06 Low-voltage switchgear and controlgear - Part 5-2: Control circuit devices and switching elements - Proximity switches; Amendment 1 More 
IEC 60947-5-2 AMD 2 2003-11 Low-voltage switchgear and controlgear - Part 5-2: Control circuit devices and switching elements; Proximity switches; Amendment 2 More 
IEC 61000-3-2 2005-11 Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase) More 
IEC 61000-3-3 1994-12 Electromagnetic compatibility (EMC) - Part 3: Limits; section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current ≤16 A More 
IEC 61000-3-3 AMD 1 2001-01 Electromagnetic compatibility (EMC) - Part 3-3: Limits; Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection; Amendment 1 More 
IEC 61000-3-3 AMD 2 2005-08 Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection; Amendment 2 More 
IEC 61000-4-11 2004-03 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests More