NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR
Abstract
This part of IEC 63551-1 specifies the standard testing conditions and testing methods that can be used to evaluate and determine the detection performance of semiconductor devices used in LiDAR systems, focusing on packaged LD-PD performance at chip-scale.
Begin
2026-08-13
Planned document number
DIN EN IEC 63551-1
Project number
02234082
