NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR
Abstract
This part of IEC 63551 specifies the testing conditions and testing procedures that can be used to evaluate and determine the optical performance of semiconductor devices used in LiDAR systems, focusing on packaged LD-PD performance at chip-scale.
Begin
2026-04-22
Planned document number
DIN EN IEC 63551-2
Project number
02233836
