NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices-Neuromorphic devices - Part 6:Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays
Abstract
This part of IEC 63550-6 specifies the test methods for evaluating the basic calculation characteristics of the one transistor one memristor (1T1M) arrays. The test methods in this international standard include parallel read, parallel write, the evaluation of writing error and residual error.
Begin
2026-04-14
Planned document number
DIN EN IEC 63550-6
Project number
02233799
