NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices
Abstract
This part of IEC 63550-5 specifies the test methods for evaluating the endurance and retention of neuromorphic memristor devices. The test methods in this international standard also include test apparatus, terms, and definitions for evaluating the endurance and retention in the neuromorphic memristor devices. This document is applicable to neuromorphic two-terminal memristor devices without any limitations prone to device technology and size.
Begin
2026-04-14
Planned document number
DIN EN IEC 63550-5
Project number
02233797
