DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025
Abstract
This part of IEC 63550 specifies the test methods for evaluating the basic characteristics of neuromorphic memristor devices. The test methods in this international standard include initialize, read, forming, potentiation and depression. This document is applicable to 2-terminal neuromorphic memristor devices without any limitations prone to device technology and size.
Begin
2025-06-27
Planned document number
DIN EN IEC 63550-1
Project number
02233217
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
draft standard
Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025
2026-05
Order from DIN Media
