DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
Abstract
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed useage of the product. This document is not intended for military- and space-related applications.
Begin
2021-06-25
Planned document number
DIN EN IEC 63287-2
Project number
02230363
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
draft standard
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
2022-06
Order from DIN Media
