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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Climate change Standards and specifications support climate targets
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Smart Farming Standards and specifications are drivers for the digitalization of agriculture
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Publications of DKE/K 631

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CLC/TR 62258-3	2007-02	Technical rule	Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC/TR 62258-3:2005) More	Order from DIN Media
CLC/TR 62258-7	2007-10	Technical rule	Semiconductor die products - Part 7: XML schema for data exchange (IEC/TR 62258-7:2007) More	Order from DIN Media
CLC/TR 62258-8	2008-08	Technical rule	Semiconductor die products - Part 8: EXPRESS model schema for data exchange (IEC/TR 62258-8:2008) More	Order from DIN Media
DIN EN 60749-1	2003-12	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003 More	Order from DIN Media
DIN EN 60749-2	2003-04	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002 More	Order from DIN Media
DIN EN 60749-3	2018-01	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017 More	Order from DIN Media
DIN EN 60749-4	2017-11	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017 More	Order from DIN Media
DIN EN 60749-5	2018-01	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017 More	Order from DIN Media
DIN EN 60749-6	2017-11	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 More	Order from DIN Media
DIN EN 60749-7	2012-02	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011 More	Order from DIN Media

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