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Standards [CURRENT]

DIN EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck (IEC 60749-2:2002); Deutsche Fassung EN 60749-2:2002

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Responsible international committee

IEC/TC 47 - Semiconductor devices

Edition 2003-04

Original language German

Price from 56.60 €

Order from DIN Media

Table of contents

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