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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

IEC 47/1615/CDV ; IEC 60749-14:2002-03 ; IEC-PN 47/60749-14:2002-03
IEC 60749-14, Ed. 1: Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

Edition 2002-03
Original language English
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