2. Getting involved
  3. Standards Committees
  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Draft standard [New]

DIN EN IEC 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 47/2770/CDV:2022); Deutsche und Englische Fassung prEN IEC 60749-5:2022

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2024-04
Publication 2024-03-08
Public enquiry period until 2024-05-08
Original language German , English
Price from 70.50 €
Read draft and comment Order from DIN Media
Table of contents

Contact

Elena Rongen

Merianstraße 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

Send message to contact