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Draft standard [Withdrawn]

DIN IEC 47(CO)1161
Semiconductor devices; measuring method for half-intensity angle and misaligment angle of an emitting device; identical with IEC 47(Central Office)1161

Title (German)

Halbleiterbauelemente; Meßverfahren für den Halbwertswinkel und die Abweichung zwischen optischer und mechanischer Achse; Identisch mit IEC 47(CO)1161

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 1991-05
Original language German
Price from 44.50 €
Order from DIN Media
Table of contents

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