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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Draft standard [Withdrawn]

DIN IEC 47(CO)1159
Semiconductor devices; measuring method for collector-emitter-saturation voltage VCE(sat) of phototransistors; identical with IEC 47(Central Office)1159

Title (German)

Halbleiterbauelemente; Meßverfahren für Kollektor-, Emitter-Sättigungsspannung VCE(sat) von Phototransistoren; Identisch mit IEC 47(CO)1159

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1991-05

Original language German

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC 47(CO)1159 Semiconductor devices; measuring method for collector-emitter-saturation voltage VCE(sat) of phototransistors; identical with IEC 47(Central Office)1159

Responsible national committee

Tim Brückmann

DIN IEC 47(CO)1159
Semiconductor devices; measuring method for collector-emitter-saturation voltage VCE(sat) of phototransistors; identical with IEC 47(Central Office)1159