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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Draft standard [Withdrawn]

DIN EN 62880-1
Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)

Title (German)

Halbleiterbauelemente - Zuverlässigkeit auf Waferniveau für Halbleiterbauelemente - Teil 1: Prüfverfahren zur Stressmigration von Kupfer (IEC 47/2191/CD:2014)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 2014-08

Original language German , English

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Table of contents

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Elena Rongen

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63069 Offenbach am Main

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 62880-1 Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)

Responsible national committee

Elena Rongen

DIN EN 62880-1
Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)