Projekt
Proposed corrigendum to IEC 61967-6 Ed1.1 Consol. with am1: Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Beginn
2010-04-30
Geplante Dokumentnummer
IEC 47A/845/DC
Zuständiges nationales Arbeitsgremium
DKE/K 631 - Halbleiterbauelemente
