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Project

Microbeam Analysis - Electron Backscattered Electron Diffraction - Vocabulary

Begin

2024-02-19

Planned document number

ISO/AWI 23699

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 1 - Terminology  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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