Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES)
Abstract
This document defines a method for the determination of the mass fractions of the elements Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, emission lines, plasma conditions and sample mass, this test method is applicable for mass fractions of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.
Begin
2023-07-14
WI
00187157
Planned document number
DIN EN 15991
Project number
06236567
Responsible national committee
NA 062-02-66 AA - Chemical analysis of ceramic and glass materials
Responsible european committee
CEN/TC 187/WG 4 - Chemical analysis
