Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for GaN crystal surface defects - Part 2: Method for determining etch pit density
Begin
2022-04-01
Planned document number
ISO 5618-2
Responsible national committee
Responsible international committee
ISO/TC 206/WG 7 - Monolithic ceramics/ Physical, mechanical and thermal properties
draft standard
Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects - Part 2: Method of determining the etch pit density
2023-10
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