Abstract

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed useage of the product. This document is not intended for military- and space-related applications.

Begin

2021-06-25

Planned document number

DIN EN IEC 63287-2

Project number

02230363

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

draft standard

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
2022-06
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