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Standards [CURRENT]

DIN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 25: Zyklische Temperaturwechsel (IEC 60749-25:2003); Deutsche Fassung EN 60749-25:2003

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Edition 2004-04
Original language German
Price from 77.90 €
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Table of contents

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