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Standards [CURRENT]

BS EN IEC 60749-10
Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly

Title (German)

Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Mechanischer Schock. Bauelemente und Unterbaugruppe

Edition 2022-08-16
Original language English
Price from 192.70 €
Table of contents