• Hydrogen Technologies Standards form the basic framework for market ramp-up

    More information

  • Climate change Standards and specifications support climate targets

    More information

  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

    More information
 
Standards [CURRENT]

ISO 23170
Surface chemical analysis - Depth profiling - Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

Title (German)

Chemische Oberflächenanalyse - Tiefenprofilierung - Zerstörungsfreie Tiefenprofilierung nanoskaliger Schwermetalloxid-Dünnschichten auf Si-Substraten mit mittelenergetischer Ionenstreuung

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 4 - Depth profiling  

Edition 2022-06
Original language English
Price from 166.60 €
Order from DIN Media
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact