Projects of DKE/K 631

DIN EN IEC 62047-54 2026-07-09 Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile More  Comment 
DIN EN IEC 63551-3 2026-04-23 Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 3: Thermal imagers More  Comment 
DIN EN IEC 63551-2 2026-04-22 Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR More  Comment 
DIN EN IEC 63550-5 2026-04-14 Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices More  Comment 
DIN EN IEC 63550-6 2026-04-14 Semiconductor devices-Neuromorphic devices - Part 6:Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays More  Comment 
DIN EN IEC 62373 2026-03-06 Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) More  Comment 
DIN EN IEC 63608-1 2026-02-25 Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1 : Mechanical reliability under shock More  Comment 
DIN EN 50766 2026-02-02 Cybersecurity requirements for tamper-resistant microprocessors and microcontrollers More  Comment 
DIN EN 50764 2026-01-30 Cybersecurity requirements for platforms of smartcards and similar devices including secure elements More  Comment 
DIN EN 50765 2026-01-30 Cybersecurity requirements for microprocessors and microcontrollers with security-related functionalities More  Comment 

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