Projects of NA 022

Document number Begin Title Comment
IEC 40/2195/CDV 2012-02-17 IEC 62391-1 Ed.2: Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification More  Comment 
IEC 55/1304/CDV 2012-02-17 IEC 60317-20/Ed3: Specifications for particular types of winding wires - Part 20: Solderable polyurethane enamelled round copper wire, class 155 More  Comment 
IEC 55/1305/CDV 2012-02-17 IEC 60317-21/Ed3: Specifications for particular types of winding wires - Part 21: Solderable polyurethane enamelled round copper wire overcoated with polyamide, class 155 More  Comment 
IEC 55/1306/CDV 2012-02-17 IEC 60317-23/Ed3: Specifications for particular types of winding wires - Part 23: Solderable polyesterimide enamelled round copper wire, class 180 More  Comment 
IEC 55/1307/CDV 2012-02-17 IEC 60317-35/Ed2: Specifications for particular types of winding wires - Part 35: Solderable polyurethane enamelled round copper wire, class 155, with a bonding layer More  Comment 
IEC 55/1308/CDV 2012-02-17 IEC 60317-36/Ed2: Specifications for particular types of winding wires - Part 36: Solderable polyesterimide enamelled round copper wire, class 180, with a bonding layer More  Comment 
IEC 55/1309/CDV 2012-02-17 IEC 60317-37/Ed2: Specifications for particular types of winding wires - Part 37: Polyesterimide enamelled round copper wire, class 180, with a bonding layer More  Comment 
IEC 55/1310/CDV 2012-02-17 IEC 60317-38/Ed2: Specifications for particular types of winding wires - Part 38: Polyester or polyesterimide overcoated with polyamide-imide, enamelled round copper wire, class 200, with a bonding layer More  Comment 
IEC 46/399/CD 2012-02-17 IEC 62153-4-4 Ed. 2.0: METALLIC COMMUNICATION CABLE TEST METHODS - Part 4-4: Electromagnetic compatibility (EMC) - Shielded screening attenuation, test method for measuring of the screening attenuation as up to and above 3 GHz More  Comment 
IEC 82/693/CDV 2012-02-10 IEC 61829 Ed.2: Crystalline silicon photovoltaic (PV) array - On-site measurement of I-V characteristics More  Comment 

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