Projects of NA 022

Document number Begin Title Comment
DIN IEC/IEEE 60079-30-1 2023-04-28 Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements (IEC 31/1768/CDV:2024); Text in German and English More  Comment 
DIN IEC/TS 61850-7-7/A1 2023-04-27 Communication networks and systems for power utility automation - Part 7-7: Machine-processable format of IEC 61850-related data models for tools (IEC 57/2471/DTS:2022) More  Comment 
DIN EN IEC 61514 2023-04-27 Industrial-process control systems - Methods of evaluating the performance of valve positioners with pneumatic outputs (IEC 65B/1256/CDV:2024); German and English version prEN IEC 61514:2024 More  Comment 
DIN EN IEC 61300-2-37 2023-04-27 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-37: Tests - Cable bending for fibre optic closures More  Comment 
DIN EN IEC 63395 2023-04-27 Sustainable management of waste electrical and electronic equipment (e-waste) (IEC 111/750/CDV:2024); German and English version prEN IEC 63395:2024 More  Comment 
DIN EN IEC 60598-1/AA 2023-04-25 Luminaires - Part 1: General requirements and tests; German and English version prEN IEC 60598-1/prAA:2023 More  Comment 
DIN EN IEC 61496-3 2023-04-25 Safety of machinery - Electro-sensitive protective equipment - Part 3: Particular requirements for active opto-electronic protective devices responsive to diffuse reflection (AOPDDR) (IEC 61496-3:2025); German version EN IEC 61496-3:2025 More  Comment 
DIN EN IEC 62321-3-1 2023-04-25 Determination of certain substances in electrotechnical products - Part 3-1: Elemental Screening by X-ray fluorescence spectrometry More  Comment 
DIN EN IEC/TS 61400-9 2023-04-25 Wind energy generation systems - Part 9: Probabilistic design measures for wind turbines (88/934/CD) More  Comment 
DIN EN IEC 63492-1 2023-04-21 Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices More  Comment 

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