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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Climate change Standards and specifications support climate targets
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Publications of NA 062

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DIN 50451-6	2014-11	Standards	Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid More	Order from DIN Media
DIN 50451-7	2018-04	Standards	Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS More	Order from DIN Media
DIN 50451-8	2022-08	Standards	Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS More	Order from DIN Media
DIN 50452-1	1995-11	Standards	Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles More	Order from DIN Media
DIN 50452-2	2009-10	Standards	Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters More	Order from DIN Media
DIN 50452-3	1995-10	Standards	Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters More	Order from DIN Media
DIN 50453-1	2023-08	Standards	Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method More	Order from DIN Media
DIN 50453-2	2023-08	Standards	Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method More	Order from DIN Media
DIN 50455-1	2009-10	Standards	Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods More	Order from DIN Media
DIN 50455-2	1999-11	Standards	Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists More	Order from DIN Media

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