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Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions (IEC 47A/996/CD:2016)

Project

LN 9407-2

Basic material for printed wiring; laminated copper clad sheets, technical specification - Inactive for new design

Integrated circuits - Three dimensional integrated circuits - Part 3: A model and measurement conditions of through silicon via (IEC 47A/997/CD:2016)

Project

LN 9407-1

Basic material for printed wiring; laminated copper clad sheets, dimensions, weigths; Inactive for new design

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Lifts for the transport of persons and goods - Part 2: Design rules, calculations, verifications and tests of lift components (ISO/FDIS 8100-2:2025)

IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)

Safety of transformers, reactors, power supply units and combinations thereof - Part 2-8: Particular requirements and tests for transformers and power supply units for bells and chimes (IEC 61558-2-8:2024); German version EN IEC 61558-2-8:2025

Miniature fuses - Part 4: Universal Modular Fuse-links (UMF) (IEC 60127-4:1996 + A1:2002 + A2:2003)

Integrated circuits - Measurement of impulse immunity - Part 2: Fast Impulse Injection method (IEC 47A/730/CD:2005)

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