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DIN EN IEC 63563-11
Qi Specification version 2.0 - Part 11: MPP Communications Protocol
DIN EN IEC 63567-1
Semiconductor devices Performance evaluation of semiconductor components and equipment - Part 1: Transmittance evaluation method of EUV pellicle
DIN EN IEC 63567-3
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
DIN EN IEC 63567-4
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
DIN EN IEC 63569
High-Level Test Description Table for Development of Production Test Programs
DIN EN IEC 63578-1
Prosumer plugs and prosumer inlets for household and similar purposes - Part 1: General requirements
DIN EN IEC 63580
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
DIN EN IEC 63581-1
The recognition criteria of defects in polished indium phosphide wafers - Part 1: Classification of defects
DIN EN IEC 63582
Low-voltage fuses - Product data and properties for information exchange (IEC 32B/742/NP:2025)
DIN EN IEC 63584-201
Open Charge Point Protocol 2.01
